Degree: PhD
Year: 1994
Institution: University of Ioannina
Discipline: Physics
Degree: B.S.
Year: 1985
Institution: University of Ioannina
Discipline: Physics
Department of Physics
Nanoelectronic materials and Devices (Si, Ge and III-V based devices, MOS structures); 2D materials for future electronics; organic/inorganic optoelectronic devices.
Dr. Evangelou's research interests include many electrical characterization techniques (such as Admittance Spectroscopy, DLTS, ICT, I-V, C-V) to study electronic or optopelectronic devices which can reveal:
(i) Concentration and dynamics of point, bulk or interface Defects.
(ii) Current conduction mechanisms and conductivity of thin films and their interfaces
(iii) Reliability aspects of the electrical and electronic properties of materials/devices due to electrical or radiation stress/damage.
10.2016 - 5.2017 | Sabbatical leave at NCSR – Demokritos |
9.2013 - today | Assoc. Professor, Dept. of Physics, UoI |
7.2003 - 8.2013 | Assist. Professor, Dept. of Physics, UoI |
10.2001 - 10.2002 | Research Fellow, Laboratorio MDM – INFM, Agrate, Milano, Italy |
11.1995 - 6.2003 | Lecturer, Dept. of Physics, UoI |
1.1996 – 1.1997 | Research Fellow, The Nottingham Trent University, Electrical and Electronic Engineering Department, Nottingham, UK |